Referenced Items are not available for this document.
A methodology which enables the calculation of threading dislocation configurations for arbitrary multi-layered structures is presented. This methodology includes strain and employs a force-balance approach to attain the equilibrium configuration. This allows technologically important properties of multi-layered structures, such as critical thickness, to be determined.
Published in:
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
Date of Conference: 11-13 Dec. 2002
- Page(s):
- 209 - 212
- ISSN :
- 1097-2137
- Print ISBN:
- 0-7803-7571-8
- INSPEC Accession Number:
- 7977206
- Digital Object Identifier :
- 10.1109/COMMAD.2002.1237229
- Product Type:
- Conference Publications
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