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Neyman-Pearson test for DC restoration error correction

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3 Author(s)
Seungjoon Yang ; Digital Media R&D Center, Samsung Electron. Co. Ltd, Suwon, South Korea ; Young Ho Lee ; Pilho Yu

Analog images often exhibit line-wise differences due to incorrectly restored DC levels. The paper presents a novel DC restoration error correction method based on statistical hypothesis testing. The proposed method can remove the line-wise error in analog images introduced during the DC restoration processes.

Published in:

IEEE Transactions on Consumer Electronics  (Volume:49 ,  Issue: 3 )