Close category search window
 

Neyman-Pearson test for DC restoration error correction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Seungjoon Yang ; Digital Media R&D Center, Samsung Electron. Co. Ltd, Suwon, South Korea ; Young Lee ; Pilho Yu

Analog images often exhibit line-wise differences due to incorrectly restored DC levels. The paper presents a novel DC restoration error correction method based on statistical hypothesis testing. The proposed method can remove the line-wise error in analog images introduced during the DC restoration processes.

Published in:
Consumer Electronics, IEEE Transactions on  (Volume:49 ,  Issue: 3 )

Date of Publication: Aug. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.