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Built-in current testing-feasibility study

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2 Author(s)
W. Maly ; Dept. of Electr. & Comput. Eng., Carnegie-Mellon Univ., Pittsburgh, PA, USA ; P. Nigh

A testing methodology which applies built-in current sensors to detect abnormal currents in the power buses of functional blocks of CMOS ICs is proposed, that significantly improves the quality of VLSI circuit testing. A summary of simulation results and design experiments is presented to demonstrate the feasibility and to illustrate the applicability of the approach. The results suggest that built-in current testing could be a very powerful tool for overcoming basic bottlenecks in VLSI testing, providing very inexpensive testing, high-quality built-in testing, or on-chip concurrent reliability testing for high-quality fault-tolerant systems.<>

Published in:

Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on

Date of Conference:

7-10 Nov. 1988