Referenced Items are not available for this document.
This paper presents a study of substrate noise effects on analog circuits and a technique for minimizing substrate noise. Measured data of a 0.25 μm CMOS test chip reveals that substrate noise couples through circuit asymmetries and nonlinearity, degrading analog circuit performance. An active substrate noise shaping circuit implemented on the same test chip demonstrates over 10 dB improvement in SNDR in the 0-20 kHz band of a delta-sigma modulator for substrate noise generated by an inverter array.
Published in:
VLSI Circuits, 2003. Digest of Technical Papers. 2003 Symposium on
Date of Conference: 12-14 June 2003
- Page(s):
- 197 - 200
- Print ISBN:
- 4-89114-034-8
- INSPEC Accession Number:
- 7869145
- Digital Object Identifier :
- 10.1109/VLSIC.2003.1221201
- Product Type:
- Conference Publications
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