By Topic

Dispersive FDTD modeling on multi-layer left-handed meta-materials for near/far field imaging at microwave frequencies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Y. Hao ; Dept. of Electron. Eng., London Univ., UK ; L. Lu ; C. G. Parini

'Perfect' imaging in left-handed meta-materials (LHMs) is constrained by evanescent wave losses. A multi-layer LHM structure can be deployed to reduce the losses, particularly in near field imaging. In this paper, we demonstrate using dispersive FDTD simulation how the multiple-layer LHM structure is used to 'guide' evanescent waves with very little attenuation over large stack thickness in near field imaging at microwave frequencies. Effect of the multi-layer structure on far field imaging is also presented. The theoretical prediction is verified by FDTD simulation with good agreement.

Published in:

Antennas and Propagation Society International Symposium, 2003. IEEE  (Volume:4 )

Date of Conference:

22-27 June 2003