Referenced Items are not available for this document.
The authors report the output RF signal distortions in the novel SiO/sub 2/-AlGaN-InGaN-GaN metal-oxide-semiconductor double heterostructure FET (MOSDHFET) device structure. Their comparative studies of MOSDHFETs and Schottky gate type DHFETs fabricated on the same wafer show significantly improved RF output signal linearity in MOSDHFETs at high-input signals. At the RF output powers close to saturation, the relative level of the second and third harmonic powers in MOSDHFETs was found to be less than -30 dB, which is about 15-20 dB lower as compared to identical geometry DHFET. This improvement is attributed to a better linearity of the MOSDHFET current-gate voltage characteristics.
Published in:
Electron Device Letters, IEEE
(Volume:24
,
Issue:
6
)
Date of Publication: June 2003
- Page(s):
- 369 - 371
- ISSN :
- 0741-3106
- INSPEC Accession Number:
- 7701407
- Digital Object Identifier :
- 10.1109/LED.2003.813355
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 22 July 2003
- Issue Date :
- June 2003
- Sponsored by :
- IEEE Electron Devices Society
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