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A n-state time-domain measurement test-bench for characterization of intermodulation distortion on device level

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4 Author(s)
Merkle, T. ; Fraunhofer Inst. for Appl. Solid-State Phys., Freiburg, Germany ; Ramberger, S. ; Kuri, M. ; van Raay, F.

A flexible nonlinear measurement system is presented for the investigation of intermodulation distortion (IMD) on device level at Ka-band frequencies. The setup is unique in the way that a passive load-pull tuner embedded inside a full two-port test-set is combined with a hybrid receiver to one fully automated test system. The calibration problem of the resulting n-state test-set is formulated with a generalized 4-port error model, for the first time. The hybrid receiver is composed of a virtual 4 channel time-domain sampling oscilloscope and a spectrum analyzer. As an application, we show various two-tone sweep-scenarios applied to our GaAs HEMTs targeting high power applications at Ka-band frequencies.

Published in:

Microwave Symposium Digest, 2003 IEEE MTT-S International  (Volume:3 )

Date of Conference:

8-13 June 2003