IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Electronics and the Environme ... Help

Lean disassembly line layout, and network simulation models

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ranky, P.G. ; Dept. of Ind. & Manuf. Syst. Eng., New Jersey Inst. of Technol., Newark, NJ, USA ; Morales, L.C. ; Caudill, R.J.

The purpose of this research is to create a simulation method and validated cases, that enable disassembly enterprises to experiment with different computer networking solutions, and protocols for electronically supported manual, and optionally automated robotized disassembly workstations (integrated into a disassembly line), to experiment with different disassembly process layout and cell/line design solutions, and to provide electronic support systems for designers and managers for evaluating 'what if?' scenarios, when developing such systems. This simulation project extends our Web-enabled Virtual Disassembly Manager (webVDM) project for electronic product/process designers, disassembly line managers and operators. webVDM is a major MERC/NJIT R&D group effort, supported by several funding agencies, companies and institutions and their hard working staff, and our RAs (Research Assistants).

Published in:
Electronics and the Environment, 2003. IEEE International Symposium on

Date of Conference: 19-22 May 2003

Page(s):
36 - 41
ISSN :
1095-2020
Print ISBN:
0-7803-7743-5
INSPEC Accession Number:
7762934
Digital Object Identifier :
10.1109/ISEE.2003.1208044
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.