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Efficient BIST schemes for RNS datapaths

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4 Author(s)
Nikolos, D.G. ; Dept. of Comput. Eng. & Inf., Patras Univ., Greece ; Nikolos, D. ; Vergos, H.T. ; Efstathiou, C.

It has recently been shown that accumulators can be used efficiently for test pattern generation as well as for test response compaction. In this paper we present a BIST scheme for accumulators where the accumulator is simultaneously used as a test pattern generator and a response compactor during its own testing. We also show that the proposed BIST scheme is especially suitable for accumulator, adder and multiplier-accumulator RNS channels leading to minimal hardware overhead and short test sequences.

Published in:

Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on  (Volume:5 )

Date of Conference:

25-28 May 2003