By Topic

Design of programmable embedded IF source for design self-test

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Choi, S. ; Florida Univ., Gainesville, FL, USA ; Eisenstadt, W. ; Fox, R.

A programmable embedded IF source has been designed for embedded communication self-test using an on-chip memory block, a shifter register, and a noise-shaping filter. An on-chip memory element is programmed with software-generated delta-sigma modulated code. The frequency of the IF source is programmable by using a variable on-chip clock generator. The design simulation shows 45 dB single-tone SFDR with a 1200 μm × 900 μm chip area. Another improved design is in progress, which is implemented with analog FIR filtering techniques. This approach relaxes the design specifications for noise shaping filters, yielding a smaller circuit.

Published in:

Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on  (Volume:5 )

Date of Conference:

25-28 May 2003