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A DOT1 & DOT4 MOSIS-compatible library

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3 Author(s)
Rucinski, A. ; Dept. of Electr. & Comput. Eng., New Hampshire Univ., Durham, NH, USA ; Stetson, B. ; Brundavani, S.T.P.

There exists a lack of balance between design and testing topics in microelectronic curricula. However, boundary scan as a virtual probe presents an opportunity to teach testing and design for testability in such a curriculum. This effort is facilitated by the use of IEEE standards, universal acceptance in industry, and the availability of low cost test equipment. This paper introduces a library of boundary scan components based on the IEEE standards. The library is being verified using the AMI 0.5 micron 40 pin Tiny Chip VLSI device fabricated through MOSIS services.

Published in:

Microelectronic Systems Education, 2003. Proceedings. 2003 IEEE International Conference on

Date of Conference:

1-2 June 2003