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2003 IEEE International Reliability Physics Symposium Proceedings 41st Annual (Cat. No.03CH37400)

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The following topics are dealt with: circuits; high k dielectrics; SER; latch-up; interconnects; BEOL dielectrics; transistors; ESD; device and process technology; compound semiconductors; SiGe; product reliability; gate dielectrics; packaging; MEMS; memories; failure analysis.

Published in:

Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International

Date of Conference:

March 30 2003-April 4 2003