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On the numerical errors induced by the space-time discretization in the LE-FDTD method

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2 Author(s)
F. Alimenti ; Dipt. di Ingegneria Elettronica e dell'Informazione, Univ. di Perugia, Italy ; L. Roselli

In this work, the accuracy of the lumped element finite-difference time-domain (LE-FDTD) method is discussed in the particular case of a planar distribution of equal resistors. Following the von Neumann technique and assuming a uniform grid, the effective impedance of the lumped resistor has been rigorously derived in a closed form. The result obtained has been compared with the LE-FDTD simulation of a simple test structure. This structure consists of an infinitely long parallel-plate waveguide loaded with the planar distribution of resistors. The excellent agreement obtained validates the approach showing a dependence of the effective resistor impedance on spatial and temporal discretization steps.

Published in:

IEEE Microwave and Wireless Components Letters  (Volume:13 ,  Issue: 3 )