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An efficient BIST method for distributed small buffers

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4 Author(s)
W. B. Jone ; Dept. of Comput. Sci. & Inf. Eng., Nat. Chung-Cheng Univ., Chiayi, Taiwan ; D. C. Huang ; S. C. Wu ; K. J. Lee

In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. Using the concept of redundant read-write operations, we develop a new march method, called RSMarch, to efficiently test each memory module. The new method has the advantages of low hardware overhead, short test time, and high-fault coverage. The total test time is dominated by large-size modules. To further reduce the test time, we also propose a split-mode test method to virtually partition each large memory array into smaller modules, which can be tested simultaneously.

Published in:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems  (Volume:10 ,  Issue: 4 )