Close category search window
 

Multiple foci drill-down through tuple and attribute aggregation polyarchies in tabular data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Conklin, N. ; Dept. of Comput. Sci., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA ; Prabhakar, S. ; North, C.

Information analysis often involves decomposing data into sub-groups to allow for comparison and identification of relationships. Breakdown Visualization provides a mechanism to support this analysis through user guided drill-down of polyarchical metadata. This metadata describes multiple hierarchical structures for organizing tuple aggregations and table attributes. This structure is seen in financial data, organizational structures, sport statistics, and other domains. A spreadsheet format enables comparison of visualizations at any level of the hierarchy. Breakdown Visualization allows users to drill-down a single hierarchy then pivot into another hierarchy within the same view. It utilizes a fix and move technique that allows users to select multiple foci for drill-down.

Published in:
Information Visualization, 2002. INFOVIS 2002. IEEE Symposium on

Date of Conference: 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.