IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Acoustics, Speech, and Signal ... Help

Knowledge based object detection

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sharman, D. ; University of Strathclyde, Scotland, UK ; Durrani, T.S.

This paper presents an attempt to combine statistical processing with symbolic processing for the detection of anomalous regions in images with noisy background. Symbolic inferences are used to provide expectations about the image to allow optimisation of statistical routines under these conditions. The approach employs a model of the image formation process and data about the domain.

Published in:
Acoustics, Speech, and Signal Processing, IEEE International Conference on ICASSP '85.  (Volume:10 )

Date of Conference: Apr 1985

Page(s):
909 - 912
Digital Object Identifier :
10.1109/ICASSP.1985.1168295
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.