Cart (Loading....) | Create Account
Close category search window

Making Fourier-envelope simulation robust

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Roychowdhury, J. ; Minnesota Univ., Minneapolis, MN, USA

Fourier-envelope algorithms are an important component of the mixed-signal/RF verification toolbox. In this paper, we address the unpredictability and lack of robustness that has been reported for these algorithms. We show that the problem stems from fast oscillations in envelopes that are expected to be slowly varying. We demonstrate that this is related to the fact that the envelope equations are always stiff, whether or not the underlying system is. We show that careful choice of envelope initial conditions is necessary to obtain useful solutions, and propose two techniques for finding good initial conditions. Applying these, and solving the envelope equations with stiffly-stable numerical methods, we improve the robustness and reliability of Fourier-envelope methods. We illustrate the new methods with a direct-downconversion mixer circuit.

Published in:

Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on

Date of Conference:

10-14 Nov. 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.