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On-chip monitors for system fault isolation

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5 Author(s)
F. D'Ambra ; Burroughs Corp., Detroit, MI, USA ; M. Menezes ; H. Muller ; H. Stopper
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On-chip circuits providing automatic, remote, and complete monitoring of all interconnects exterior to the die will be covered in this report. Proper monitor/logic sensitivity ratio assures detection of incipient faults and simplifies device testing, monitoring of on-chip functionality and final fault isolation.

Published in:

Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International  (Volume:XXI )

Date of Conference:

15-17 Feb. 1978