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Buried injector logic: Second generation I2L performance

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1 Author(s)
Yiannoulos, A. ; Bell Laboratories, Reading, PA, USA

A vertically structured I2L gate, integrated with linear SBC processing, will be discussed. Previous (standard I2L) logic/linear function conflicts stemming from structural constraints have been reconciled, demonstrating second generation I2L performance with unrestrained SBC capability.

Published in:
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International  (Volume:XXI )

Date of Conference: 15-17 Feb. 1978

Page(s):
12 - 13
Conference Location :
San Francisco, CA, USA
Digital Object Identifier :
10.1109/ISSCC.1978.1155812
Product Type:
Conference Publications

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