Cart (Loading....) | Create Account
Close category search window
 

Nodal shift impedance measurements in periodic waveguides

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Jaynes, E. ; Stanford University, Stanford, CA, USA

The nodal shift method of measuring the properties of a Coupling system connecting two transmission lines is a convenient and accurate method which does not require the existence of good terminations to match the lines. Using a generalized definition of impedance in a periodically loaded waveguide, such as is encountered in the Stanford linear accelerator or in traveling-wave tubes, this technique can be extended to determining the properties of a coupling system connected between a smooth waveguide and the periodic one, and when these are known, one can measure impedances in the periodic structure by observing those in the smooth guide. In addition, this impedance relation permits one to deduce the phase-shift constant of the structure at any frequency in the pass-band.

Published in:

Antennas and Propagation, Transactions of the IRE Professional Group on  (Volume:PGAP-4 )

Date of Publication:

Dec 1952

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.