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Testable design and support tool for cell based test

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4 Author(s)
T. Ogihara ; Mitsubishi Electr. Corp., Kanagawa, Japan ; Y. Koseko ; G. Yonemori ; H. Kawai

The authors describe a testable design method and the corresponding support tool for testing large-scale cells embedded on LSIs. The testable design method requires very little extra hardware to increase testability. The support tool enables users to test the large-scale cells by using already prepared test patterns. Consequently, test generation, and fault simulation times are decreased

Published in:

Test Conference, 1990. Proceedings., International

Date of Conference:

10-14 Sep 1990