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Identification of faulty processing elements by space-time compression of test responses

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3 Author(s)
Karpovsky, M.G. ; Dept. of Electr. Comput. & Syst. Eng., Boston Univ., MA, USA ; Levitin, L.B. ; Vainstein, F.S.

A novel approach to the identification of a faulty processing element, based on an analysis of the compressed response of the system, is proposed. The test response is compressed first in space and then in time, and a faulty processing element is identified by a hard-decision decoding of the corresponding space-time signature. The overhead analysis and the solution for the hardware minimization problem are presented for several important classes of systems. The proposed method results in considerable hardware savings

Published in:

Test Conference, 1990. Proceedings., International

Date of Conference:

10-14 Sep 1990