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The technique for automatic testing of electronic components must be adapted to the requirements for each individual test program. This paper describes the methods employed in instrumenting two test programs. The first involves approximately 75,000 components of four types - resistors, diodes, transistors and capacitors - all being tested for an extended period under environmental and electrical load conditions. The second program, in contrast, describes the parameter measurements which have to be made on small quantities of semiconductor devices under nuclear radiation con- ditions.