By Topic

A New Approach to the Attainment of the Highest Possible Reliability in Tantalum Capacitors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Burnham, John ; Ti-Tal Inc.

The question of how to achieve the highest possible reliability for Tantalum capacitors is discussed from both the theoretical and practical point of view. A method of achieving reliabilities of the order 95 per cent at a confident level of 95 per cent or better is described which involves an analytical treatment of the physics of the main mode of failure, all accounting for over 90 per cent of a failure; and a statistical model is derived which demonstrates this reliability on a highly accelerated test. The test is applicable on a 100 per cent basis to the test capacitors and, as it is nondestructive, it allows the attainment of a reliability figure for each individual unit. This also provides a method of attaining very high reliabilities at a low cost and the test can be carried out in 24 hours or less.

Published in:

Component Parts, IEEE Transactions on  (Volume:12 ,  Issue: 1 )