IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Component Parts, IEEE Transac ...> Volume:11 Issue:1 Help

Current-Voltage Relations for Thin-Film Tunneling Structures

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Scales, J., III ; Harry Diamond Lab., Washington D.C.

Current-voltage characteristics have been calculated for a structure consisting of two metal surfaces separated by a thin film of "insulating" material. The analysis includes both tunneling and thermionic emission, and takes account of dielectric constant and image force. Curves of current density vs field strength are presented for various values of barrier height and dielectric constant. Several comparisons of theory with experiment are given, and it is concluded that the theory overemphasizes the thermionic contribution.

Published in:
Component Parts, IEEE Transactions on  (Volume:11 ,  Issue: 1 )

Date of Publication: Mar 1964

Page(s):
9 - 15
ISSN :
0097-6601
Digital Object Identifier :
10.1109/TCP.1964.1134968
Product Type:
Journals & Magazines
Date of Current Version :
06 January 2003
Issue Date :
Mar 1964

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.