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The noise of gold and aluminum films was measured. All noise spectra are the 1/f type. The noise of the gold films increases in proportion to the fifth power of the resistance in the high resistance range and to the cube of the resistance in the low resistance range. The noise of thin films is qualitatively characterized. The resistance dependences were explained by a static-contact model and granular-resistor model, respec- tively.
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on (Volume:10 , Issue: 4 )
Date of Publication: Dec 1987