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New instrumentation for validating performance warranty clauses and obtaining MTBF and maintenance scheduling data

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1 Author(s)
Story, J.K. ; Curtis Instrum. Inc., Mt. Kisco, NY, USA

Curtis Instruments has used advances in CMOS-EEPROM technology to upgrade the state of the art in measuring elapsed-use time and events. The resulting devices, how they work, and applications relative to logistics responsibilities are described. In-application parameters are discussed. Real-world application experience is set forth in a manner that can be related to most electronic, electromechanical, and mechanical equipment. Qualification status is reviewed. Data gathering is addressed to illustrate capabilities for computerized data acquisition. References throughout Department of Defense documentation are cited for the desirability of the discussed tamper-proof acquisition of data to determine warranty status for both performance and mean time between failure (MTBF) incentive programs

Published in:

Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National

Date of Conference:

21-25 May 1990