In the work, evidence and role of minority carrier extraction at the high defect concentration interface metal-semi-insulating (SI) GaAs is presented. Improvement of performance of radiation detector based on SI GaAs if extraction system is used as quasi-ohmic "back" electrode is demonstrated.
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Advanced Semiconductor Devices and Microsystems, 2002. The Fourth International Conference on
Date of Conference: 14-16 Oct. 2002