Referenced Items are not available for this document.
A method is derived to measure the integral and differential nonlinearity of an ADC using a sinewave with unknown amplitude and offset. The uncertainty of the measurement is also estimated. In a second phase, the integral nonlinearity is analyzed, using Walsh Transforms, to identify the nonlinearity at the bit level of the ADC.
Published in:
Circuits and Systems, IEEE Transactions on
(Volume:33
,
Issue:
8
)
Date of Publication: Aug 1986
- Page(s):
- 775 - 785
- ISSN :
- 0098-4094
- Digital Object Identifier :
- 10.1109/TCS.1986.1086004
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 January 2003
- Issue Date :
- Aug 1986
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