By Topic

The characterization of magnetic bubble-domain materials with X-ray topography

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
W. Stacy ; Philips Research Laboratory, Eindhoven, The Netherlands ; U. Enz

The use of X-ray topography to characterize magnetic bubble materials is discussed. By mapping the crystal strains, the technique reveals defects which can influence the bubble domains and which are not easily observed by other methods. Examples of topographs are given for flux grown iron garnets, Czochralski grown Gd3Ga5O12substrate crystals, and LPE iron garnet layers. The influence of substrate defects on the magnetic film is demonstrated. Transmission topographs of substrate-film combinations have not revealed an intermediate layer of misfit dislocations. The application of X-ray topography to a study of the growth induced anisotropy in magnetic garnets is also described. The topographs reveal a correlation between regions having a particular growth band symmetry and those having a particular noncubic anisotropy.

Published in:

IEEE Transactions on Magnetics  (Volume:8 ,  Issue: 3 )