Cart (Loading....) | Create Account
Close category search window
 

A novel method for predicting the onset of intraventricular hemorrhage in premature infants by using near infrared spectroscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Bozkurt, Y.A. ; Sch. of Biomed. Eng., Sci., & Health Syst., Drexel Univ., Philadelphia, PA, USA ; Rosen, H. ; Rosen, A. ; Pourrezaei, Kambiz
more authors

Premature babies are under high risk of brain injury during the care period in nursery. The most common observed injury is intraventricular hemorrhage (IVH). Existing monitoring technology is neither efficient nor sufficient for predicting IVH before it occurs. Near Infrared (NIR) light can be used for continuous monitoring of neonate brain in real time and providing predictive, quantitative parameters for early detection of IVH. A method to predict onset of IVH by using cerebral oxygen saturation information obtained via NIR spectroscopy is presented.

Published in:

Engineering in Medicine and Biology, 2002. 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society EMBS/BMES Conference, 2002. Proceedings of the Second Joint  (Volume:3 )

Date of Conference:

23-26 Oct. 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.