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A phase-spectrum-based approach to the dynamic characterization of hysteretic analog-to-digital converters is proposed. Analytical relations between hysteresis of the dynamic transfer characteristic and out-of-phase components of the output Fourier spectrum are given. On this basis, an error model, a figure of merit, and a procedure for dynamic hysteresis testing are presented. Results of numerical characterization and experimental validation tests highlight the practical effectiveness of the proposed approach and its suitability for standardization.
Instrumentation and Measurement, IEEE Transactions on (Volume:51 , Issue: 4 )
Date of Publication: Aug 2002