IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Instrumentation and Measureme ...> Volume:51 Issue:4 Help

An implantable analyzer of bio-impedance dynamics: mixed signal approach [telemetric monitors]

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Min, M. ; Tallinn Tech. Univ., Estonia ; Parve, T. ; Kukk, V. ; Kuhlberg, A.

An on-chip implantable lock-in analyzer of variations of the electrical bio-impedance has been designed, and pilot ASICs have been fabricated and tested. A mixed signal approach as the most suitable way for accomplishing a low-voltage and low-power ASIC for use in implantable devices for various biomedical applications is discussed in this paper.

Published in:
Instrumentation and Measurement, IEEE Transactions on  (Volume:51 ,  Issue: 4 )

Date of Publication: Aug 2002

Page(s):
674 - 678
ISSN :
0018-9456
INSPEC Accession Number:
7450782
Digital Object Identifier :
10.1109/TIM.2002.803085
Product Type:
Journals & Magazines
Date of Current Version :
10 December 2002
Issue Date :
Aug 2002
Sponsored by :
IEEE Instrumentation and Measurement Society

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.