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A class of random multiple bits within a byte error correcting codes with single byte error detecting capability for memory systems

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2 Author(s)
Umanesan, G. ; Graduate Sch. of Inf. Sci. & Eng., Tokyo Inst. of Technol., Japan ; Fujiwara, E.

We propose a class of codes called single t-bits within a b-bit byte error correcting-single b-bit byte error detecting (Stb/EC-SbED) code for high speed semiconductor memory systems.

Published in:

Information Theory, 2002. Proceedings. 2002 IEEE International Symposium on

Date of Conference:

2002