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Repeat measurements and metrics for nonlinear model development

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5 Author(s)
Remley, K.A. ; Nat. Inst. of Stand. & Technol., Boulder, CO, USA ; Jargon, J.A. ; Schreurs, D. ; DeGroot, D.C.
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We develop a method to study nonlinear models using metrics in conjunction with repeat measurements. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.

Published in:

Microwave Symposium Digest, 2002 IEEE MTT-S International  (Volume:3 )

Date of Conference:

2-7 June 2002