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An error corrected two-tone time domain measurement system has been developed and combined with a low frequency active source and load-pull system to investigate the effects of all impedance terminations, IF and RF, on the linearity and efficiency of power transistors. Measured data is presented on a HBT biased in class B stimulated by-a two-tone signal while actively load pulling the low frequency IF component.
Microwave Symposium Digest, 2002 IEEE MTT-S International (Volume:3 )
Date of Conference: 2-7 June 2002