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Millimeter-wave network analyzers based on photonic techniques

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5 Author(s)
T. Nagatsuma ; NTT Telecommun. Energy Labs., NTT Corp., Kanagawa, Japan ; N. Sahri ; A. Hirata ; Y. Royter
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We report on active photonic probes which enable on-wafer measurements of electrical scattering parameters with a bandwidth exceeding 300 GHz. The probes employ a high-speed uni-traveling-carrier photodiode to optically generate the electrical stimulus and the electro-optic sampling technique to measure the electrical response signals. The probe modules are packaged using micro-optic technology and exhibit excellent optical characteristics. They are easy to use and enable reliable and reproducible measurements and should help to overcome the bandwidth-limitation of present all-electronic systems.

Published in:

Microwave Symposium Digest, 2002 IEEE MTT-S International  (Volume:3 )

Date of Conference:

2-7 June 2002