Referenced Items are not available for this document.
Circuit internal test techniques working in a contactless manner are necessary for failure analysis and design verification of high-speed and high-frequency circuits. A relative new technique is the scanning probe voltage measurement technique, a technique which is based on scanning probe microscopy. This paper gives an overview of the state-of-the-art of this technique and demonstrates some practical examples.
Published in:
Microwave Symposium Digest, 2002 IEEE MTT-S International
(Volume:3
)
Date of Conference: 2-7 June 2002
- Page(s):
- 1493 - 1496 vol.3
- Meeting Date :
- 02 Jun 2002-07 Jun 2002
- ISSN :
- 0149-645X
- Print ISBN:
- 0-7803-7239-5
- INSPEC Accession Number:
- 7322209
- Conference Location :
- Seattle, WA, USA
- Digital Object Identifier :
- 10.1109/MWSYM.2002.1012138
- Product Type:
- Conference Publications
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