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Application of decision trees for integrated circuit yield improvement

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1 Author(s)
Raghavan, V. ; Agere Syst., Singapore

In order to meet high expectations on yield targets, quick identification of root cause for yield loss is essential. Decision trees are shown to be a powerful data mining tool for integrated circuit yield improvement. Several case studies from yield improvement efforts on real products have been presented.

Published in:

Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop

Date of Conference:

2002