By Topic

Irreversible magnetization processes in exchange biased NiO-(Cu)-NiFe films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
de Haas, O. ; IFW-Dresden, Dresden, Germany ; Schaefer, R. ; Schultz, L. ; Schneider, C.M.

Summary form only given. Exchange coupling between ferromagnetic and antiferromagnetic films provides a fixed reference magnetization, which is essential for spin-valves in magnetoelectronic devices based on GMR or TMR effects. In this paper the stability of the reference magnetization is addressed by means of domain studies on NiO (10 nm)/Cu (0.5 nm)/Permalloy (10 nm) layers using Kerr microscopy. Low-temperature observation in an optical cryostat was necessary, because the coupling temperature is reduced to about 200K for a 10 nm thick NiO film. The Cu spacer layer reduces, but does not prevent the exchange coupling between Permalloy and NiO.

Published in:

Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International

Date of Conference:

April 28 2002-May 2 2002