Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

VSPEC and its integrated tool suite

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Rangarajan, M. ; Honeywell Labs., Minneapolis, MN, USA ; Jambhekar, K. ; Rajkhowa, A. ; Alexander, P.

In this paper, we describe an integrated tool suite for VSPEC specifications that addresses systems level correctness. The functional correctness of a design is analyzed using the proof obligation generator. The proof obligation generator identifies various properties that must hold for a design to be correct. It then creates a model of the system in the PVS theorem proving language and also generates the properties as theorems to be proved. The performance constraints of the system are analyzed by extracting the relevant information and modeling it as constraint satisfaction problems to be answered by the PDL analyzer. To test the correspondence between the requirements and implementation, test vectors are generated from the specifications and are used in the simulation of the implementation. Using all these tools, it is possible to analyze the correctness of the abstract design and ensure that the implementation satisfies the original requirements

Published in:

Engineering of Computer-Based Systems, 2002. Proceedings. Ninth Annual IEEE International Conference and Workshop on the

Date of Conference:

2002