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Shape and reflectance from an image sequence generated using extended sources

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3 Author(s)
S. K. Nayar ; Robotics Inst., Carnegie-Mellon Univ., Pittsburgh, PA, USA ; K. Ikeuchi ; T. Kanade

The authors present a method for determining the shapes of surfaces whose reflectance properties may vary from Lambertian to specular, without prior knowledge of the relative strengths of the Lambertian and specular components of reflection. The object surface is illuminated using extended light sources and is viewed from a single direction. Surface illumination using extended sources makes it possible to ensure the detection of both Lambertian and specular reflections. Multiple source directions are used to obtain an image sequence of the object. An extraction algorithm uses the set of image intensity values measured at each surface point to compute orientation as well as relative strengths of the Lambertian and specular reflection components. The proposed method is called photometric sampling, as it uses samples of photometric function that relates image intensity to surface orientation, reflectance, and light source characteristics. Experiments were conducted on Lambertian surfaces, specular surfaces, and hybrid surfaces, whose reflectance models are composed of both Lambertian and specular components. The results show high accuracy in measured orientations and estimated reflectance parameters

Published in:

Robotics and Automation, 1989. Proceedings., 1989 IEEE International Conference on

Date of Conference:

14-19 May 1989