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Magnetic properties of CoSm thin films with Cr80V20 and Cr as underlayers

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2 Author(s)
I. Zana ; Dept. of Metall. & Mater. Eng., Alabama Univ., Tuscaloosa, AL, USA ; G. Zangari

We investigated the static and time-dependent magnetic properties of thin CoSm films (6-14 nm) on CrV underlayers. We measured remanent coercivities of up to 4.5 kOe and viscosity coefficients as low as 8%/decade for 14-nn films with remanent moment thickness product of 0.49 memu/cm2. We compared magnetic hardness, interactions, viscosity, and anisotropy with similar films grown on Cr underlayers, and found that CrV constitutes a better underlayer for CoSm thin film media, most probably because of improved epitaxy at the interface and a more favorable interface, microstructure, and topography

Published in:

IEEE Transactions on Magnetics  (Volume:38 ,  Issue: 3 )