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Incremental diagnosis and correction of multiple faults and errors

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4 Author(s)
Veneris, A. ; Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada ; Liu, J.B. ; Amiri, M. ; Abadir, M.S.

An incremental simulation-based approach to fault diagnosis and logic debugging is presented. During each iteration of the algorithm, a single suspicious location is identified and fault modeled such that the functionality of the new design becomes "closer" to its specification. The method is based on a simple and, at a first glance, counter-intuitive theoretical result along with a number of heuristics which help avoid the exponential complexity inherent to the problems. Experiments on multiple design errors and multiple stuck-at faults confirm its effectiveness and accuracy, which scales well with increasing number of errors

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Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings

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