By Topic

Fast electromagnetic characterisation method of thin planar materials using coplanar line up to V-band

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hinojosa, J. ; Departamento de Electron., Univ. Politecnica de Cartagena, Murcia ; Lmimouni, K. ; Dambrine, G.

A very broadband method for determining the electromagnetic properties of isotropic thin planar materials, which uses a coplanar line as a cell, is presented. The complex permittivity is quickly computed from S-parameter measurements of coplanar cells propagating the dominant mode by using analytical equations. Measurements between 0.05 and 75 GHz of alumina and doped silicon show good agreement between measured and predicted values

Published in:

Electronics Letters  (Volume:38 ,  Issue: 8 )