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Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition

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The following topics are dealt with: semiconductor IP; formal verification; cooling; power management; defect oriented test; SAT and BDD techniques; low power design; mixed signal test; collaborative design; logic synthesis; symbolic techniques; EDA tools; analogue circuits; asynchronous circuits; BIST; DFT; co-design; SoC; embedded systems; reconfigurable architectures; analogue modelling; object oriented design; interconnect modelling; fault tolerance; ATPG; high-level synthesis; and IC modelling.

Published in:

Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings

Date of Conference:

8-8 March 2002