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TixZr1-x underlayers for CoCrPtB perpendicular magnetic recording media

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5 Author(s)
Hsu, Yu-Nu ; Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA ; Wierman, Kurt W. ; Bin Lu ; Klemmer, Timothy J.
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We describe the effects of TixZr1-x underlayers on the microstructural and magnetic properties of CoCrPtB layers. We found that as the Zr atomic composition increases in the Ti xZr1-x underlayers, the unit cells of the Tix Zr1-x underlayers expand. The TixZr1-x (0002) texture is strongest as the Zr atomic composition ranges from 40% to 60%. In addition, the CoCrPtB (0002) texture induced by the (0002) textured TixZr1-x underlayer is enhanced at these optimizing Zr compositions. The grain size of the CoCrPtB layers deposited onto the TixZr1-x, underlayers is around 7.5-9.5 nm. Stacking fault streaks observed by transmission electron microscopy indicate that stacking faults exist in the CoCrPtB films with the TixZr1-x underlayers. The Hc (coercivity) and S* (squareness) of the CoCrPtB magnetic layers deposited onto the pure Ti and Zr underlayer were higher than those with the TiZr alloy underlayers

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Magnetics, IEEE Transactions on  (Volume:38 ,  Issue: 2 )