Cart (Loading....) | Create Account
Close category search window
 

Characterization of dielectric films for power capacitors by space charge technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Reboul, J.M. ; LUSAC, Univ. de Caen Basse-Normandie, France ; Rouff, M. ; Carin, R.

For the last ten years, space charge measurements are used to value the electrical quality of insulating materials. However, the various measurement methods are not adapted to the polymer films employed for the manufacture of power capacitors. The present work is concerned with the development of the new alternative thermal wave method based on the processing of the current response of film samples submitted to alternative thermal stimulations. A thermo-electrical module is used to generate the alternative thermal stimulations. The current response is processed as arising from an equivalent pattern of discrete charged planes parallel to the film faces. Some results obtained with this method on 100 μm thick and 20 μm thick polypropylene films are given. The resolving power of the method and its ability for thinner films are discussed.

Published in:

Electrical Insulation, 2002. Conference Record of the 2002 IEEE International Symposium on

Date of Conference:

7-10 Apr 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.