Cart (Loading....) | Create Account
Close category search window

Fading channels: how perfect need "perfect side information" be?

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lapidoth, A. ; Dept. of Electr. Eng., Swiss Fed. Inst. of Technol., Zurich, Switzerland ; Shamai, S.

The analysis of flat-fading channels is often performed under the assumption that the additive noise is white and Gaussian, and that the receiver has precise knowledge of the realization of the fading process. These assumptions imply the optimality of Gaussian codebooks and of scaled nearest-neighbor decoding. Here we study the robustness of this communication scheme with respect to errors in the estimation of the fading process. We quantify the degradation in performance that results from such estimation errors, and demonstrate the lack of robustness of this scheme. For some situations we suggest the rule of thumb that, in order to avoid degradation, the estimation error should be negligible compared to the reciprocal of the signal-to-noise ratio (SNR)

Published in:

Information Theory, IEEE Transactions on  (Volume:48 ,  Issue: 5 )

Date of Publication:

May 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.