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A partitioning and storage based built-in test pattern generation method for scan circuits

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2 Author(s)
Pomeranz, I. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Reddy, S.M.

We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is partitioned into several sets containing values of different primary inputs or state variables. The on-chip test set is obtained by implementing the Cartesian product of the various sets. The sets are reduced as much as possible before they are stored on-chip in order to reduce the storage requirements and the test application time

Published in:

Design Automation Conference, 2002. Proceedings of ASP-DAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design. Proceedings.

Date of Conference:

2002

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